Bufford, Daniel C <br/><br/>
High Cycle Fatigue in the Transmission Electron Microscope.  [electronic resource] 

 -  Nano letters  08 2016 
 - 4946-53 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S. 
<br/><br/><label>ISSN: </label>1530-6992 
<br/><br/><label>Standard No.: </label>10.1021/acs.nanolett.6b01560  doi