Teranishi, Nobukazu <br/><br/>
Analysis of Subthreshold Current Reset Noise in Image Sensors.  [electronic resource] 

 -  Sensors (Basel, Switzerland)  May 2016 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1424-8220 
<br/><br/><label>Standard No.: </label>10.3390/s16050663  doi