TY  - GEN
AU  - Zheng,Yan-Zong
AU  - Soo,Yun-Liang
AU  - Chang,Shih-Lin
TI  - Depth profiles of the interfacial strains of Si0.7Ge0.3/Si using three-beam Bragg-surface diffraction
SN  - 2045-2322
PY  - 2018///0316
N1  - Publication Type: Journal Article; Research Support, Non-U.S. Gov't
UR  - https://doi.org/10.1038/srep25580
ER  -