Huang, Zhen <br/><br/>
The Effect of Polar Fluctuation and Lattice Mismatch on Carrier Mobility at Oxide Interfaces.  [electronic resource] 

 -  Nano letters  Apr 2016 
 - 2307-13 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1530-6992 
<br/><br/><label>Standard No.: </label>10.1021/acs.nanolett.5b04814  doi