TY  - GEN
AU  - Ryu,Hoon
TI  - A multi-subband Monte Carlo study on dominance of scattering mechanisms over carrier transport in sub-10-nm Si nanowire FETs
SN  - 1931-7573
PY  - 2016///0128
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1186/s11671-016-1249-4
ER  -