Ryu, Hoon <br/><br/>
A multi-subband Monte Carlo study on dominance of scattering mechanisms over carrier transport in sub-10-nm Si nanowire FETs.  [electronic resource] 

 -  Nanoscale research letters  Dec 2016 
 - 36 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1931-7573 
<br/><br/><label>Standard No.: </label>10.1186/s11671-016-1249-4  doi