Guo, Quan <br/><br/>
High-Order Measurements for Residual Classifiers.  [electronic resource] 

 -  IEEE transactions on neural networks and learning systems  05 2017 
 - 1030-1042 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>2162-2388 
<br/><br/><label>Standard No.: </label>10.1109/TNNLS.2016.2515128  doi