Ma, Bingyang <br/><br/>
An improved preparation method for cross-sectional TEM specimens of films deposited on metallic substrates.  [electronic resource] 

 -  Microscopy research and technique  Apr 2016 
 - 276-9 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1097-0029 
<br/><br/><label>Standard No.: </label>10.1002/jemt.22627  doi