Schick, Daniel <br/><br/>
Ultrafast lattice response of photoexcited thin films studied by X-ray diffraction.  [electronic resource] 

 -  Structural dynamics (Melville, N.Y.)  Nov 2014 
 - 064501 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>2329-7778 
<br/><br/><label>Standard No.: </label>10.1063/1.4901228  doi