Kozina, M <br/><br/>
Measurement of transient atomic displacements in thin films with picosecond and femtometer resolution.  [electronic resource] 

 -  Structural dynamics (Melville, N.Y.)  May 2014 
 - 034301 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>2329-7778 
<br/><br/><label>Standard No.: </label>10.1063/1.4875347  doi