TY  - GEN
AU  - You,Seung-Won
AU  - Lee,Dong Hwi
AU  - Nguyen,Manh Cuong
AU  - Jeon,Yoon Seok
AU  - Tong,Duc-Tai
AU  - Bang,Hyun Joon
AU  - Jeong,Jae Kyoung
AU  - Choi,Rino
TI  - Effects of La Incorporation in Hf Based Dielectric on Leakage Conduction and Carrier Scattering Mechanisms
SN  - 1533-4899
PY  - 2016///0208
N1  - Publication Type: Journal Article; Research Support, Non-U.S. Gov't
UR  - https://doi.org/10.1166/jnn.2015.11165
ER  -