TY  - GEN
AU  - Ko,Sun Wook
AU  - Kim,Soon Kon
AU  - Kim,Jong Min
AU  - Cho,Jae Hee
AU  - Park,Hyoung Sun
AU  - Choi,Byoung Deog
TI  - Electrical Properties and Reliability Analysis of Solution-Processed Indium Tin Zinc Oxide Thin Film Transistors with O2-Plasma Treatment
SN  - 1533-4899
PY  - 2016///0208
N1  - Publication Type: Journal Article; Research Support, Non-U.S. Gov't
UR  - https://doi.org/10.1166/jnn.2015.11168
ER  -