Ko, Sun Wook <br/><br/>
Electrical Properties and Reliability Analysis of Solution-Processed Indium Tin Zinc Oxide Thin Film Transistors with O2-Plasma Treatment.  [electronic resource] 

 -  Journal of nanoscience and nanotechnology  Oct 2015 
 - 7476-81 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1533-4899 
<br/><br/><label>Standard No.: </label>10.1166/jnn.2015.11168  doi