TY - GEN AU - Bordes,Arnaud AU - De Vito,Eric AU - Haon,Cédric AU - Secouard,Christophe AU - Montani,Alexandre AU - Marcus,Philippe TI - Investigation of Lithium Insertion Mechanisms of a Thin-Film Si Electrode by Coupling Time-of-Flight Secondary-Ion Mass Spectrometry, X-ray Photoelectron Spectroscopy, and Focused-Ion-Beam/SEM SN - 1944-8252 PY - 2016///0425 N1 - Publication Type: Journal Article UR - https://doi.org/10.1021/acsami.5b09261 ER -