Fitzek, H <br/><br/>
High-quality imaging in environmental scanning electron microscopy--optimizing the pressure limiting system and the secondary electron detection of a commercially available ESEM.  [electronic resource] 

 -  Journal of microscopy  Apr 2016 
 - 85-91 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1365-2818 
<br/><br/><label>Standard No.: </label>10.1111/jmi.12347  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Hydrostatic Pressure<br/>Microscopy, Electron, Scanning--instrumentation