TY  - GEN
AU  - Kumar,Mohit
AU  - Som,Tapobrata
TI  - Structural defect-dependent resistive  switching in Cu-O/Si studied by Kelvin probe  force microscopy and conductive atomic  force microscopy
SN  - 1361-6528
PY  - 2015///1014
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1088/0957-4484/26/34/345702
ER  -