Kumar, Mohit <br/><br/>
Structural defect-dependent resistive  switching in Cu-O/Si studied by Kelvin probe  force microscopy and conductive atomic  force microscopy.  [electronic resource] 

 -  Nanotechnology  Aug 2015 
 - 345702 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1361-6528 
<br/><br/><label>Standard No.: </label>10.1088/0957-4484/26/34/345702  doi