Naka, T <br/><br/>
Analysis system of submicron particle tracks in the fine-grained nuclear emulsion by a combination of hard x-ray and optical microscopy.  [electronic resource] 

 -  The Review of scientific instruments  Jul 2015 
 - 073701 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1089-7623 
<br/><br/><label>Standard No.: </label>10.1063/1.4926350  doi