TY  - GEN
AU  - Tranca,D E
AU  - Stanciu,S G
AU  - Hristu,R
AU  - Stoichita,C
AU  - Tofail,S A M
AU  - Stanciu,G A
TI  - High-resolution quantitative determination of dielectric function by using scattering scanning near-field optical microscopy
SN  - 2045-2322
PY  - 2016///0108
N1  - Publication Type: Journal Article; Research Support, Non-U.S. Gov't
UR  - https://doi.org/10.1038/srep11876
ER  -