Tranca, D E <br/><br/>
High-resolution quantitative determination of dielectric function by using scattering scanning near-field optical microscopy.  [electronic resource] 

 -  Scientific reports  Jul 2015 
 - 11876 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>2045-2322 
<br/><br/><label>Standard No.: </label>10.1038/srep11876  doi