TY  - GEN
AU  - Xu,Xiao-Ping
AU  - Volkmann,Niels
TI  - Validation methods for low-resolution fitting of atomic structures to electron microscopy data
SN  - 1096-0384
PY  - 2015///1030
KW  - Cryoelectron Microscopy
KW  - methods
KW  - Models, Molecular
KW  - Molecular Structure
KW  - Structure-Activity Relationship
N1  - Publication Type: Journal Article; Research Support, N.I.H., Extramural
UR  - https://doi.org/10.1016/j.abb.2015.06.017
ER  -