Ping Wang, Yan <br/><br/>
Quantitative evaluation of microtwins and antiphase defects in GaP/Si nanolayers for a III-V photonics platform on silicon using a laboratory X-ray diffraction setup.  [electronic resource] 

 -  Journal of applied crystallography  Jun 2015 
 - 702-710 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>0021-8898 
<br/><br/><label>Standard No.: </label>10.1107/S1600576715009954  doi