Han, Jae Hwan <br/><br/>
Scale effects on stiction-induced release voltage shift of nano-electromechanical (NEM) memory cells.  [electronic resource] 

 -  Journal of nanoscience and nanotechnology  Dec 2014 
 - 9589-93 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1533-4880 
<br/><br/><label>Standard No.: </label>10.1166/jnn.2014.10162  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electricity<br/>Finite Element Analysis