TY  - GEN
AU  - Jung,Hyun Soo
AU  - Ryu,Ju Tae
AU  - Kim,Dong Hun
AU  - Kim,Tae Whan
TI  - Mobility degradation mechanisms of MOSFETs with a high-k dielectric layer
SN  - 1533-4899
PY  - 2015///0529
N1  - Publication Type: Journal Article; Research Support, Non-U.S. Gov't
UR  - https://doi.org/10.1166/jnn.2014.9896
ER  -