Jung, Hyun Soo <br/><br/>
Mobility degradation mechanisms of MOSFETs with a high-k dielectric layer.  [electronic resource] 

 -  Journal of nanoscience and nanotechnology  Nov 2014 
 - 8215-8 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1533-4899 
<br/><br/><label>Standard No.: </label>10.1166/jnn.2014.9896  doi