TY  - GEN
AU  - Woo,Myung Hun
AU  - Ryu,Ju Tae
AU  - Kim,Tae Whan
TI  - Effect of the fixed charge distribution on the mobility degradation of the high-k dielectric MOSFETs
SN  - 1533-4899
PY  - 2015///0529
N1  - Publication Type: Journal Article; Research Support, Non-U.S. Gov't
ER  -