Woo, Myung Hun <br/><br/>
Effect of the fixed charge distribution on the mobility degradation of the high-k dielectric MOSFETs.  [electronic resource] 

 -  Journal of nanoscience and nanotechnology  Nov 2014 
 - 8211-4 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1533-4899