TY  - GEN
AU  - Wang,Wei
AU  - Hwang,Sun Kak
AU  - Kim,Kang Lib
AU  - Lee,Ju Han
AU  - Cho,Suk Man
AU  - Park,Cheolmin
TI  - Highly reliable top-gated thin-film transistor memory with semiconducting, tunneling, charge-trapping, and blocking layers all of flexible polymers
SN  - 1944-8252
PY  - 2015///0820
N1  - Publication Type: Journal Article; Research Support, Non-U.S. Gov't
UR  - https://doi.org/10.1021/acsami.5b02213
ER  -