Lee, Chibum <br/><br/>
Model based control of dynamic atomic force microscope.  [electronic resource] 

 -  The Review of scientific instruments  Apr 2015 
 - 043703 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1089-7623 
<br/><br/><label>Standard No.: </label>10.1063/1.4917301  doi