Choi, Jin Sik <br/><br/>
Correlation between micrometer-scale ripple alignment and atomic-scale crystallographic orientation of monolayer graphene.  [electronic resource] 

 -  Scientific reports  Dec 2014 
 - 7263 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S. 
<br/><br/><label>ISSN: </label>2045-2322 
<br/><br/><label>Standard No.: </label>10.1038/srep07263  doi