TY  - GEN
AU  - Fumagalli,L
AU  - Edwards,M A
AU  - Gomila,G
TI  - Quantitative electrostatic force microscopy with sharp silicon tips
SN  - 1361-6528
PY  - 2015///0330
N1  - Publication Type: Journal Article; Research Support, Non-U.S. Gov't
UR  - https://doi.org/10.1088/0957-4484/25/49/495701
ER  -