Fumagalli, L <br/><br/>
Quantitative electrostatic force microscopy with sharp silicon tips.  [electronic resource] 

 -  Nanotechnology  Dec 2014 
 - 495701 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1361-6528 
<br/><br/><label>Standard No.: </label>10.1088/0957-4484/25/49/495701  doi