TY  - GEN
AU  - Ohkubo,T
AU  - Sepehri-Amin,H
AU  - Sasaki,T T
AU  - Hono,K
TI  - Multi-scale characterization by FIB-SEM/TEM/3DAP
SN  - 2050-5701
PY  - 2016///0121
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1093/jmicro/dfu046
ER  -