Srinivasan, Avinash <br/><br/>
Probing and analyzing buried interfaces of multifunctional oxides using a secondary electron energy analyzer.  [electronic resource] 

 -  Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada  Oct 2014 
 - 1494-8 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1435-8115 
<br/><br/><label>Standard No.: </label>10.1017/S1431927614012781  doi