Tanji, T <br/><br/>
Scanning image detection (SID) system for conventional transmission electron microscope (CTEM) images.  [electronic resource] 

 -  Journal of electron microscopy technique  Aug 1990 
 - 397-9 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>0741-0581 
<br/><br/><label>Standard No.: </label>10.1002/jemt.1060150409  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Image Processing, Computer-Assisted--instrumentation<br/>Magnesium Oxide<br/>Microscopy, Electron--methods