TY  - GEN
AU  - Yamasaki,Jun
AU  - Mutoh,Michihiro
AU  - Ohta,Shigemasa
AU  - Yuasa,Syuichi
AU  - Arai,Shigeo
AU  - Sasaki,Katsuhiro
AU  - Tanaka,Nobuo
TI  - Analysis of nonlinear intensity attenuation in bright-field TEM images for correct 3D reconstruction of the density in micron-sized materials
SN  - 2050-5701
PY  - 2015///0330
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1093/jmicro/dfu020
ER  -