Stéphan, Odile <br/><br/>
Enhanced data generated with electrons (EDGE) special issue introduction.  [electronic resource] 

 -  Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada  Jun 2014 
 - 647-8 p.  digital 
<br/><br/> Publication Type: Introductory Journal Article 
<br/><br/><label>ISSN: </label>1435-8115 
<br/><br/><label>Standard No.: </label>10.1017/S1431927614000920  doi