Huang, Chenhui <br/><br/>
Trapped charge density analysis of KTN crystal by beam path measurement.  [electronic resource] 

 -  Optics express  Apr 2014 
 - 7783-9 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1094-4087 
<br/><br/><label>Standard No.: </label>10.1364/OE.22.007783  doi