TY  - GEN
AU  - Raegen,Adam N
AU  - Reiter,Kyle
AU  - Dion,Alexander
AU  - Clarke,Anthony J
AU  - Lipkowski,Jacek
AU  - Dutcher,John R
TI  - Advances in surface plasmon resonance imaging enable quantitative tracking of nanoscale changes in thickness and roughness
SN  - 1520-6882
PY  - 2015///0618
KW  - Cellulose
KW  - chemistry
KW  - Nanotechnology
KW  - Polymethyl Methacrylate
KW  - Surface Plasmon Resonance
KW  - methods
KW  - Surface Properties
N1  - Publication Type: Journal Article; Research Support, Non-U.S. Gov't
UR  - https://doi.org/10.1021/ac4034664
ER  -