Ergincan, O <br/><br/>
Note: spring constant calibration of nanosurface-engineered atomic force microscopy cantilevers.  [electronic resource] 

 -  The Review of scientific instruments  Feb 2014 
 - 026118 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1089-7623 
<br/><br/><label>Standard No.: </label>10.1063/1.4864195  doi