Wessels, W A <br/><br/>
Fast and gentle side approach for atomic force microscopy.  [electronic resource] 

 -  The Review of scientific instruments  Dec 2013 
 - 123704 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1089-7623 
<br/><br/><label>Standard No.: </label>10.1063/1.4847055  doi