TY  - GEN
AU  - Shepard,Michele Noble
AU  - Brenner,Sara
TI  - An occupational exposure assessment for engineered nanoparticles used in semiconductor fabrication
SN  - 1475-3162
PY  - 2015///0810
KW  - Aerosols
KW  - analysis
KW  - Air Pollutants, Occupational
KW  - Aluminum Oxide
KW  - Diatomaceous Earth
KW  - Environmental Monitoring
KW  - methods
KW  - Filtration
KW  - instrumentation
KW  - Humans
KW  - Inhalation Exposure
KW  - Microscopy, Electron, Transmission
KW  - Nanoparticles
KW  - Occupational Exposure
KW  - Semiconductors
KW  - Spectrometry, X-Ray Emission
KW  - Workplace
N1  - Publication Type: Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S
UR  - https://doi.org/10.1093/annhyg/met064
ER  -