Shepard, Michele Noble <br/><br/>
An occupational exposure assessment for engineered nanoparticles used in semiconductor fabrication.  [electronic resource] 

 -  The Annals of occupational hygiene  Mar 2014 
 - 251-65 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S. 
<br/><br/><label>ISSN: </label>1475-3162 
<br/><br/><label>Standard No.: </label>10.1093/annhyg/met064  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Aerosols--analysis<br/>Air Pollutants, Occupational--analysis<br/>Aluminum Oxide--analysis<br/>Diatomaceous Earth--analysis<br/>Environmental Monitoring--methods<br/>Filtration--instrumentation<br/>Humans<br/>Inhalation Exposure--analysis<br/>Microscopy, Electron, Transmission<br/>Nanoparticles--analysis<br/>Occupational Exposure--analysis<br/>Semiconductors<br/>Spectrometry, X-Ray Emission<br/>Workplace