Volet, Nicolas <br/><br/>
Transverse mode discrimination in long-wavelength wafer-fused vertical-cavity surface-emitting lasers by intra-cavity patterning.  [electronic resource] 

 -  Optics express  Nov 2013 
 - 26983-9 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1094-4087 
<br/><br/><label>Standard No.: </label>10.1364/OE.21.026983  doi