Wang, X <br/><br/>
In-process measuring of the electrical shunt resistance of laser-scribed thin-film stacks by nested circular scribes.  [electronic resource] 

 -  The Review of scientific instruments  Oct 2013 
 - 104704 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1089-7623 
<br/><br/><label>Standard No.: </label>10.1063/1.4824119  doi