Koppal, Sanjeev J Toward wide-angle microvision sensors. [electronic resource] - IEEE transactions on pattern analysis and machine intelligence Dec 2013 - 2982-96 p. digital Publication Type: Journal Article; Research Support, U.S. Gov't, Non-P.H.S. ISSN: 1939-3539 Standard No.: 10.1109/TPAMI.2013.22 doi