TY  - GEN
AU  - Stefenelli,Mario
AU  - Todt,Juraj
AU  - Riedl,Angelika
AU  - Ecker,Werner
AU  - Müller,Thomas
AU  - Daniel,Rostislav
AU  - Burghammer,Manfred
AU  - Keckes,Jozef
TI  - X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison
SN  - 0021-8898
PY  - 2013///
PB  - Journal of applied crystallography
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1107/S0021889813019535
ER  -