Stefenelli, Mario <br/><br/>
X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison.  [electronic resource] 

 -  Journal of applied crystallography  Oct 2013 
 - 1378-1385 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>0021-8898 
<br/><br/><label>Standard No.: </label>10.1107/S0021889813019535  doi