Somodi, P K <br/><br/>
Finite element simulations of electrostatic dopant potentials in thin semiconductor specimens for electron holography.  [electronic resource] 

 -  Ultramicroscopy  Nov 2013 
 - 160-6 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1879-2723 
<br/><br/><label>Standard No.: </label>10.1016/j.ultramic.2013.06.023  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electrons<br/>Holography--instrumentation<br/>Microscopy, Electron, Transmission--instrumentation<br/>Semiconductors<br/>Static Electricity