Bartl, D <br/><br/>
Probing timescales during back side ablation of Molybdenum thin films with optical and electrical measurement techniques.  [electronic resource] 

 -  Optics express  Jul 2013 
 - 16431-43 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1094-4087 
<br/><br/><label>Standard No.: </label>10.1364/OE.21.016431  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Conductometry--methods<br/>Lasers<br/>Materials Testing--methods<br/>Membranes, Artificial<br/>Molybdenum--analysis<br/>Refractometry--methods